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JOHNSTECH INT CORP

Overview
  • Total Patents
    165
  • GoodIP Patent Rank
    54,826
About

JOHNSTECH INT CORP has a total of 165 patent applications. Its first patent ever was published in 1992. It filed its patents most often in United States, EPO (European Patent Office) and Taiwan. Its main competitors in its focus markets measurement, electrical machinery and energy and audio-visual technology are JUNG YOUNG SEOK, SHANGHAI ZENFOCUS SEMI TECH CO LTD and UREX PREC INC.

Patent filings per year

Chart showing JOHNSTECH INT CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Johnson David A 35
#2 Sherry Jeffrey C 26
#3 Kline Eric V 21
#4 Gilk Mathew L 19
#5 Michalko Gary W 17
#6 Halvorson Brian 17
#7 Andres Michael 17
#8 Nelson John E 16
#9 Alladio Patrick J 13
#10 Shell Dennis B 12

Latest patents

Publication Filing date Title
CN111164434A High isolation contactor with test pins and housing for integrated circuit testing
US9606143B1 Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
CN105393408A On-center electrically conductive pins for integrated testing
WO2015006625A2 Testing apparatus for wafer level ic testing
US9429591B1 On-center electrically conductive pins for integrated testing
US9476936B1 Thermal management for microcircuit testing system
US9341649B1 On-center electrically conductive pins for integrated testing
US9274141B1 Low resistance low wear test pin for test contactor
WO2013059249A1 Improved electrically conductive kelvin contacts for microcircuit tester
US2013099810A1 Electrically conductive Kelvin contacts for microcircuit tester
WO2012151104A1 Compliant contact plate for use in testing integrated circuits
US2013002285A1 Electrically Conductive Pins For Microcircuit Tester
TW201317582A Improved electrically conductive kelvin contacts for microcircuit tester
TW201224464A Electrically conductive pins for microcircuit tester
SG175302A1 Electrically conductive kelvin contacts for microcircuit tester
SG174288A1 Electrically conductive pins for microcircuit tester
EP2319129A1 Test contact system for testing integrated circuits with packages having an array of signal and power contacts
MY152126A A contact insert for a microcircuit test socket
SG144898A1 A contact insert for a microcircuit test socket
US2008218177A1 Contact insert for a microcircuit test socket