US2015377570A1
|
|
Apparatus to control device temperature utilizing multiple thermal paths
|
US8550443B1
|
|
Method and apparatus for holding microelectronic devices
|
WO2011038297A1
|
|
Apparatus for holding microelectronic devices
|
WO2011038295A1
|
|
Carrier for holding microelectronic devices
|
US2010273364A1
|
|
Axially compliant microelectronic contactor
|
US2010022105A1
|
|
Connector for microelectronic devices
|
US2010045322A1
|
|
Probe head apparatus for testing semiconductors
|
US7491069B1
|
|
Self-cleaning socket for microelectronic devices
|
US7442045B1
|
|
Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
|
US2008290504A1
|
|
Compliant thermal contactor
|
US2008290503A1
|
|
Compliant thermal contactor
|
US2008196474A1
|
|
Method and apparatus for aligning and/or leveling a test head
|
CN101385204A
|
|
High performance electrical connector
|
US2007197099A1
|
|
High performance electrical connector
|
US2007269999A1
|
|
Socket for an electronic device
|
US2007267188A1
|
|
Method and apparatus for setting and controlling temperature
|
US2007268031A1
|
|
Wafer probe interconnect system
|
US2007288823A1
|
|
Apparatus including a fluid coupler interfaced to a test head
|
US2007273398A1
|
|
Mounting apparatus
|