ISEMICON INC has a total of 13 patent applications. Its first patent ever was published in 1998. It filed its patents most often in Republic of Korea, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, control and it methods for management are PANNESE PATRICK D, FUNK MERRITT and BERKELEY PROCESS CONTROL INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | Republic of Korea | 6 | |
#2 | United States | 2 | |
#3 | WIPO (World Intellectual Property Organization) | 2 | |
#4 | China | 1 | |
#5 | EPO (European Patent Office) | 1 | |
#6 | Taiwan | 1 |
# | Industry | |
---|---|---|
#1 | Semiconductors | |
#2 | Control | |
#3 | IT methods for management | |
#4 | Environmental technology | |
#5 | Measurement |
# | Name | Total Patents |
---|---|---|
#1 | Koo Heung Seob | 6 |
#2 | Lee Jae Keun | 5 |
#3 | Lee Jae Geun | 4 |
#4 | Lee Jae-Keun | 2 |
#5 | Lee Jae Gun | 1 |
#6 | Keun Lee Jae | 1 |
#7 | Seob Koo Heung | 1 |
Publication | Filing date | Title |
---|---|---|
KR20090077601A | The method of multi-variate parameter control limit by yield management | |
KR100679721B1 | The statistic analysis of fault detection and classification in semiconductor manufacturing | |
KR100679722B1 | The method of making a periodic time of prevent maintenance in semiconductor manufacturing | |
KR20070046993A | The way of wafer tracing in semiconductor manufacturing | |
KR20050040502A | Management method of product information in production line | |
KR20000008962A | Method of measurement of yield loss chips and poor chips classified by a type according to defected chips on the wafer |