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IPS SYSTEM CO LTD

Overview
  • Total Patents
    21
  • GoodIP Patent Rank
    205,542
About

IPS SYSTEM CO LTD has a total of 21 patent applications. Its first patent ever was published in 2005. It filed its patents most often in Republic of Korea, China and Singapore. Its main competitors in its focus markets semiconductors, audio-visual technology and computer technology are Guan zhi-bin, KUNSHAN VISIONOX DISPLAY CO LTD and UNIVERSAL SCIENT IND CO LTD.

Patent filings in countries

World map showing IPS SYSTEM CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 18
#2 China 1
#3 Singapore 1
#4 Taiwan 1

Patent filings per year

Chart showing IPS SYSTEM CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Su Jin 18
#2 Na Yoon Sung 2
#3 Cho Young Man 1
#4 Jeong Gap Ryeol 1
#5 Lee Su-Jin 1
#6 Yu Jea Seok 1
#7 Son Jae Hyun 1
#8 Kim In Chan 1
#9 Jin Lee Su 1

Latest patents

Publication Filing date Title
KR20190113045A Solar cell and method of manufacturing the same
KR20190094963A Method of printing transparent electrode for touch panel and transparent electrode for touch panel manufactured by the same
KR20160073886A Speaker in condenser type
KR20150107963A Touch panel and Method of manufacturing a touch panel
KR101415604B1 Touch screen panel
KR101424617B1 Micro speaker and method for assembling the same
KR20130143291A Method for manufacturing touch screen panel
KR20130109301A Apparatus for inspecting and repairing solder paste
KR20130066798A Apparatus for bonding chip
KR101191368B1 Apparatus for fixing substrate
KR101090816B1 Apparatus for bonding semiconductor chip
KR101044622B1 Apparatus for bonding semiconductor chip
KR20110104387A Unit for adsorption circuit board and apparatus for bonding circuit board using the same
KR20110096872A Unit for imaging board and apparatus for bonding circuit board using the same
KR20090128752A Apparatus for bonding chip or film on glass and method for bonding chip or film on glass using the same
KR20090095837A Apparatus for inspecting edge area of wafer, method using the same, and method for aligning wafer
KR20080003543A Apparatus for adjusting a gap
KR20060100965A Apparatus for measuring weight automatically