| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 11 |
| # | Industry | |
|---|---|---|
| #1 | Optics | |
| #2 | Measurement | |
| #3 | Semiconductors | |
| #4 | Mechanical elements |
| # | Technology | |
|---|---|---|
| #1 | Photomechanical semiconductor production | |
| #2 | Measuring length, angles and areas | |
| #3 | Semiconductor devices | |
| #4 | Springs |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hoogendam Christiaan Alexander | 11 |
| #2 | Streefkerk Bob | 7 |
| #3 | Loopstra Erik Roelof | 7 |
| #4 | Mulkens Johannes Catharinus Hubertus | 4 |
| #5 | Mertens Jeroen Johannes Sophia Maria | 4 |
| #6 | Slaghekke Bernardus Antonius | 4 |
| #7 | Tinnemans Patricius Aloysius Jacobus | 4 |
| #8 | Bijlaart Erik Theodorus Maria | 4 |
| #9 | Kolesnychenko Aleksey Yurievich | 4 |
| #10 | Van Santen Helmar | 4 |
| Publication | Filing date | Title |
|---|---|---|
| US2008225244A1 | Lithographic apparatus and method |