SHANGAHI HUALI MICROELECTRONICS CORP has a total of 45 patent applications. Its first patent ever was published in 2011. It filed its patents most often in China. Its main competitors in its focus markets optics are CHIME BALL TECHNOLOGY CO LTD, SANRITSU KIKAKU KK and TOYOTA MAX KK.
Shape design of novel critical dimension monitoring structure
CN102437101A
Improved method for integrating hard mask and porous material with low dielectric constant value
CN102435616A
Monitoring method of stability of crystal edge detector
CN102437100A
Method for simultaneously forming copper contact hole and first metal layer by dual damascene technique
CN102437098A
Forming method of contact hole for reducing contact resistance
CN102436132A
Method for optical proximity correction based on different substrates
CN102437097A
Novel manufacturing method of contact hole
CN102437160A
Static memory active region structure and SRAM (system random access memory) layout
CN102437157A
Preparation method of CMOS (complementary metal oxide semiconductor) device capable of implementing multistage working voltage by single-thickness gate oxide layer
CN102437099A
Forming method of contact hole structure for reducing resistance of contact hole
CN102437056A
Method for parasitizing vertical plug and play (PNP) tube in complementary metal oxide semiconductor process
CN102437037A
Method for effectively reducing water mark defects
CN102437163A
CMOS (Complementary Metal Oxide Semiconductor) structure of wide forbidden band material on insulator and preparation method thereof
CN102436149A
Method for confirming photoetching process window
CN102437164A
Wide band gap complementary metal oxide semiconductor (CMOS) structure on insulator and preparation method thereof
CN102437117A
Novel process for integrating silicide and metal foredielectric and forming structure thereof
CN102437129A
Localized SOI (Silicon-On-Insulator) and GOI (Germanium On Insulator) device structure and process integrating method thereof
CN102437096A
Manufacture method for reducing contact resistance of contact hole