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HEFEI NEXCHIP INTEGRATED CIRCUIT CO LTD

Overview
  • Total Patents
    57
  • GoodIP Patent Rank
    26,120
About

HEFEI NEXCHIP INTEGRATED CIRCUIT CO LTD has a total of 57 patent applications. Its first patent ever was published in 2018. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, computer technology and measurement are SMIC SEMICONDUCTOR MFG SHANGHAI CO LTD, JUENGLING WERNER and FUJIO MASUOKA.

Patent filings in countries

World map showing HEFEI NEXCHIP INTEGRATED CIRCUIT CO LTDs patent filings in countries
# Country Total Patents
#1 China 57

Patent filings per year

Chart showing HEFEI NEXCHIP INTEGRATED CIRCUIT CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Gengchuan 9
#2 Li Qingmin 7
#3 Li Jiancai 4
#4 Jin Qizhun 4
#5 Taya Masatoshi 3
#6 Xu Chunlong 3
#7 Natsume Hidetaka 3
#8 Chen Sunhong 3
#9 Yang Zongkai 3
#10 Yin Saisai 3

Latest patents

Publication Filing date Title
CN112171513A Polishing pad processing method and chemical mechanical polishing equipment
CN112034677A Overlay mark, overlay mark method and overlay measuring method
CN111933644A Flash memory unit and manufacturing method thereof
CN111627810A Semiconductor structure and manufacturing method thereof
CN111613530A Method for manufacturing semiconductor structure
CN111599748A Method for manufacturing interconnection structure
CN111599808A Semiconductor device and method for manufacturing the same
CN111599813A Semiconductor structure and manufacturing method thereof
CN111584616A Semiconductor structure and forming method thereof
CN111584419A Method for forming trench isolation structure and trench isolation structure
CN111430294A Manufacturing method of trench isolation structure and semiconductor device
CN111430236A Wafer annealing method
CN111430349A Semiconductor structure and manufacturing method thereof
CN111430329A Capacitive semiconductor element
CN111524857A Semiconductor structure and preparation method thereof
CN111446156A Semiconductor structure forming method and semiconductor structure
CN111427240A Method for establishing optical data correction model
CN111403333A Semiconductor structure and preparation method thereof
CN111276532A Semiconductor device and preparation method thereof
CN111430452A Unit structure of multi-time programmable memory and manufacturing method thereof