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Probe on carrier architecture for vertical probe arrays
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MEMS probe card assembly with decoupled electrical and mechanical probe connections
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Direct metalized guide plate
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Vertical probe array having a tiled membrane space transformer
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Probe head with inductance reducing structure
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Shielding for vertical probe heads
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LED light source probe card technology for testing CMOS image scan devices
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Multipath electrical probe and probe assemblies with signal paths through and secondary paths between electrically conductive guide plates
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Automated attaching and detaching of an interchangeable probe head
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A probe card assembly for testing electronic devices
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Vertical probes for multi-pitch full grid contact array
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Probe fabrication using combined laser and micro-fabrication technologies
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Wiring substrate with filled vias to accommodate custom terminals
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Probes with programmable motion
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Hybrid electrical contactor
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Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such
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Probes with spring mechanisms for impeding unwanted movement in guide holes
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