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FILMETRICS INC

Overview
  • Total Patents
    24
  • GoodIP Patent Rank
    211,989
About

FILMETRICS INC has a total of 24 patent applications. Its first patent ever was published in 1998. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, electrical machinery and energy and optics are HORIBA FRANCE SAS, BRUKER OPTIK GMBH and FEDERALNOE GOSUDARSTVENNOE BYUDZHETNOE UCHREZHDENIE NAUKI NAUCHNO TEKH TSENTR UNIKALNOGO PRIBOROSTRO.

Patent filings in countries

World map showing FILMETRICS INCs patent filings in countries

Patent filings per year

Chart showing FILMETRICS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chalmers Scott A 24
#2 Geels Randall S 14
#3 Bibby Thomas F A 4

Latest patents

Publication Filing date Title
US2017108688A1 Optical system for use with microscope
US2017108377A1 Determining focus condition in spectral reflectance system
US2013250294A1 Automatic real-time wavelength calibration of fiber-optic-based spectrometers
US2013258333A1 Correction of second-order diffraction effects in fiber-optic-based spectrometers
WO2013109612A1 High-lifetime broadband light source for low-power applications
WO2011088011A1 Fiber-based optical probe with decreased sample-positioning sensitivity
US2008180684A1 Thin-film metrology using spectral reflectance with an intermediate in-line reference
WO2006078471A2 Determining wafer orientation in spectral imaging
US2006164657A1 Determining wafer orientation in spectral imaging
WO2006071651A2 Spectral imaging of substrates
WO2006014263A2 Method and apparatus for high-speed thickness mapping of patterned thin films
WO2005083352A1 Method and apparatus for high-speed thickness mapping of patterned thin films
EP1622743A2 Whole-substrate spectral imaging system for cmp
US7095511B2 Method and apparatus for high-speed thickness mapping of patterned thin films
US6184985B1 Spectrometer configured to provide simultaneous multiple intensity spectra from independent light sources
US6172756B1 Rapid and accurate end point detection in a noisy environment
US6204922B1 Rapid and accurate thin film measurement of individual layers in a multi-layered or patterned sample