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ETAMAX CO LTD

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    180,464
  • Filing trend
    ⇩ 50.0%
About

ETAMAX CO LTD has a total of 17 patent applications. It decreased the IP activity by 50.0%. Its first patent ever was published in 2009. It filed its patents most often in Republic of Korea, Taiwan and United States. Its main competitors in its focus markets measurement, optics and electrical machinery and energy are NEO MONITORS AS, TOSHIBA BETSUKUMAN KK and OPSIS AB.

Patent filings in countries

World map showing ETAMAX CO LTDs patent filings in countries

Patent filings per year

Chart showing ETAMAX CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Jung Hyun Don 6
#2 Kim Youngbeom 4
#3 Han Dong Pyo 3
#4 Jung Huyn Don 3
#5 Jung Huyndon 3
#6 Kim Young Bum 2
#7 Shim Jong-In 2
#8 Jung Hyundon 2
#9 Choi Woo Seok 2
#10 Shim Jong In 2

Latest patents

Publication Filing date Title
KR102067972B1 Led inspection system capable of simultaneous detection of photoluminescence and scattered light
KR101810078B1 System for defect detection by photoluminescence and scattering measurement of a sample
KR101801032B1 Photoluminescence Intensity Mapping Instrument using Central Wavelength Tracking
KR101754148B1 Curvature measurement apparatus
KR101552103B1 Optical Pyrometer for Measuring Temperatures of Substrate and Susceptor
WO2014021623A1 Method and device for measuring internal quantum efficiency of an optical element
KR20140017440A Method and apparatus for measuring internal quantum efficiency of led
KR20130088371A Module for testing light emitting diode
TW201329435A Measurement system and method for improving distortion in measurement of photoluminescence intensity of light emitting diode wafer
TW201330130A Method for displaying susceptor mapping images of light emitting diode wafers
KR20120066479A Semiconductor measuring apparatus and semiconductor measuring method
KR20110078354A Semiconductor measuring apparatus and semiconductor measuring method
KR20110029857A Light emitting diode measuring apparatus and light emitting diode measuring method
KR20100094094A Method of manufacturing a light emitting device