Device for force-displacement measurements on layers
DE10215506A1
Specifying reference magnetizations in layer systems e.g. in magnetoresistive sensor elements, involves applying hard and/or soft magnetic layer to antiferromagnetic layer(s) before, during or after single- or multi-stage heating
DE10215505A1
Antiferromagnetic layer system used for magnetic storage consists of a ferromagnetic layer and an antiferromagnetic layer
DE10143679C1
Determining mechanical properties of thin coatings involves measuring force-displacement profile of coating on two-part bearer body stuck onto one-piece bearer body with gap
DE10116935A1
Acoustic surface wave component
DE10114934A1
Production of superconducting wires or strips by deforming or heat treating a composite comprising a tube containing a powdered superconducting magnesium boride or its powdered pre-product and a normal conducting powder
DE10110292C1
Current-dependent resistive component
DE10062847C1
Transversal coupled resonator filter for acoustic surface waves has adjacent single gate resonator structures
DE10061398C1
Production of metallic strips for deposition of biaxially textured layers of superconductor material comprises forming alloy containing nickel, copper, silver or their alloys and additive, rolling, recrystallization annealing and annealing
DE10061399C1
Single layer or multiple layer metal strip used for epitaxial coating with a biaxially textured layer made from high temperature superconducting material consists of a base material made from nickel, copper, silver or their alloys
DE10053941A1
Metal strap made of silver or a silver-based alloy
EP1214458A2
Method for producing massive-amorphous layers on massive metallic shaped bodies
DE10043664A1
Surface structure analysis method for workpiece sample uses correlation between surface structure data and microscopic image of surface or between different surface images
DE10039824A1
Resonator filter based on surface acoustic waves e.g. bandpass filter, has two or more one-port resonator structures and planar cavities of differing lengths
DE10036482C1
Magnetization measuring device for material sample has measuring coil enclosing material sample and compensation coil for compensating measuring inaccuracy at ends of measuring coil
DE10031229C1
Current-dependent resistive component used as a switch, sensor or memory element has a layer system consisting of two ferromagnetic manganate layers divided by an epitaxially grown insulating material layer
DE10027645A1
Process for the production of massively amorphous layers on massive metallic moldings
DE10013833A1
Device for vertical transport of semiconductor wafers and disks comprises carrier unit with cooled, magnetised, superconducting strips which interact with permanent magnets so that carrier unit is suspended on air cushion of constant height
