DELMIC B V has a total of 27 patent applications. Its first patent ever was published in 2011. It filed its patents most often in EPO (European Patent Office), WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets electrical machinery and energy, optics and measurement are HENNYZ B V, HWANG CHA-WON and HITACHI ELECTRIONIC DEVICES CO.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 10 | |
#2 | WIPO (World Intellectual Property Organization) | 10 | |
#3 | United States | 4 | |
#4 | Netherlands | 3 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Optics | |
#3 | Measurement |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Optical systems | |
#3 | Analysing materials | |
#4 | Measuring distances |
# | Name | Total Patents |
---|---|---|
#1 | Hoogenboom Jacob Pieter | 22 |
#2 | Kruit Pieter | 16 |
#3 | Zonnevylle Aernout Christiaan | 9 |
#4 | Liv Hamarat Nalan | 5 |
#5 | Nalan Liv Hamarat | 2 |
#6 | De Pinth Wilhelmus Johannes Adriaan | 2 |
#7 | Moerland Robert Jan | 2 |
#8 | Effting Andries Pieter Johan | 2 |
#9 | Liv Nalan | 2 |
#10 | Haring Martijn Theo | 2 |
Publication | Filing date | Title |
---|---|---|
EP3245663A1 | Sample holder for use in both a light optical microscope and a charged particle microscope | |
NL2013432B1 | Compact inspection apparatus comprising a combination of a Scanning Electron Microscope and an Optical microscope. | |
NL2013262B1 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope. | |
NL2012874B1 | Method for positioning a focal plane of a light imaging device and apparatus arranged for applying said method. | |
EP2896061A1 | Integrated optical and charged particle inspection apparatus |