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CSMC TECHNOLOGIES CORP

Overview
  • Total Patents
    276
  • GoodIP Patent Rank
    76,994
About

CSMC TECHNOLOGIES CORP has a total of 276 patent applications. Its first patent ever was published in 2009. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, optics and environmental technology are YANGZHOU GUOYU ELECTRONICS CO LTD, BEIJING ZHONGKE FEIHONG SCIENCE & TECHNOLOGY CO LTD and PROCESS LAB MICRON CO LTD.

Patent filings in countries

World map showing CSMC TECHNOLOGIES CORPs patent filings in countries
# Country Total Patents
#1 China 276

Patent filings per year

Chart showing CSMC TECHNOLOGIES CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Li Jian 21
#2 Wei Huang 18
#3 Chen Yawei 13
#4 Hu Jun 13
#5 Xu Zongneng 12
#6 Lian Xiaoqian 11
#7 Zhou Yaohui 10
#8 Huang Wei 10
#9 Wang Zhewei 9
#10 Jian Li 9

Latest patents

Publication Filing date Title
CN105336703A Manufacturing method for semiconductor device
CN105334703A Configuration method for exposure units
CN105336691A Preparation method of well region
CN105261558A Manufacturing method for semiconductor
CN105223781A A kind of stepper contraposition method for supervising
CN105140186A Method for manufacturing semiconductor device
CN105215009A A kind of method removing pvd chamber body inwall product
CN105097486A Polycrystalline silicon etching method
CN105097579A Measuring method, etching method, and forming method of semiconductor device
CN105097420A Temperature calibration method for MASSON quick heat treatment stock
CN105097421A Temperature calibration method for MASSON rapid thermal processing machine
CN105097491A Chemical mechanical polishing technology based on silicon oxynitride antireflection layer
CN104977820A Method for removing photoresist though PR rework and semiconductor forming method
CN104900515A Semiconductor device etching method and semiconductor device formation method
CN104899789A Product production abnormity processing method
CN104882389A Semiconductor device measurement method
CN104882358A Method for detecting polymer in etching chamber
CN104882375A Anti-defect semiconductor device etching method and semiconductor device forming method
CN104865798A Size selection method of exposure fields in photoetching processes
CN104851819A Method for temperature monitoring in ion implantation process