ETEC CORP has a total of 20 patent applications. Its first patent ever was published in 1970. It filed its patents most often in United States, Germany and United Kingdom. Its main competitors in its focus markets electrical machinery and energy, measurement and surface technology and coating are BRUKER SCIENT LLC, TRIMPIN SARAH and MUKAIBATAKE KAZUO.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 8 | |
#2 | Germany | 5 | |
#3 | United Kingdom | 3 | |
#4 | France | 2 | |
#5 | Japan | 2 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Measurement | |
#3 | Surface technology and coating |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Analysing materials | |
#3 | Coating metallic material |
# | Name | Total Patents |
---|---|---|
#1 | Yew Nelson C | 5 |
#2 | Lane Wyman C | 2 |
#3 | Yew N | 2 |
#4 | Koch George R | 2 |
#5 | Petersen Carl T | 2 |
#6 | Dao J | 2 |
#7 | Otsuki Mitsuo | 2 |
#8 | Colby David H | 2 |
#9 | Ono Koichi | 1 |
#10 | Konuma Sumihiro | 1 |
Publication | Filing date | Title |
---|---|---|
JP2005235126A | Temporary employee evaluation system and temporary employee evaluation sheet | |
JP2003281325A | Carrier perspective system and discrimination apparatus | |
US3915118A | Specimen coating device for an SEM | |
US3958124A | Method and apparatus for sem specimen coating and transfer | |
US3878392A | Specimen analysis with ion and electrom beams | |
US3858049A | Method and apparatus for sem specimen coating and transfer | |
US3886305A | Automatic contrast and dark level control for scanning electron microscopes | |
US3787696A | Scanning electron microscope electron-optical column construction | |
GB1362535A | Scanning electron microscope | |
US3711711A | Scanning electron microscope scanning system | |
US3676670A | Electron gun biasing system |