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ANAM SEMICONDUCTOR LTD

Overview
  • Total Patents
    1,449
About

ANAM SEMICONDUCTOR LTD has a total of 1,449 patent applications. Its first patent ever was published in 1994. It filed its patents most often in Republic of Korea, Japan and United States. Its main competitors in its focus markets semiconductors, optics and electrical machinery and energy are DONGBU ELECTRONICS CO LTD, DONGBUANAM SEMICONDUCTOR INC and SEMICONDUCTOR INT IC MANUFACTURE SHANGHAI CO LTD.

Patent filings in countries

World map showing ANAM SEMICONDUCTOR LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 1,439
#2 Japan 9
#3 United States 1

Patent filings per year

Chart showing ANAM SEMICONDUCTOR LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Cho Gyeong Su 63
#2 Ko Gwan Ju 60
#3 Kim Tae Hun 50
#4 Han Gyeong Su 48
#5 Seo Yeong Hun 42
#6 Lee Dae Geun 39
#7 Park Geon Uk 30
#8 Oh Sang Hun 26
#9 Kim Jae Yeong 25
#10 Kim U Yong 21

Latest patents

Publication Filing date Title
KR20040082541A Test apparatus of semiconductor device and method for preventing burnt probe of the device
KR20040070647A Method for manufacturing reverse trench of semiconductor devices
KR20040070579A Slurry filter box
KR20040070708A Method for forming an air gap in a semiconductor metal line manufacturing process
KR20040070609A Apparatus for mechanical clamp of an ion implant equipment
KR20040070818A Bake unit for formation process of semiconductor
KR20040070634A Faraday assembly of an ion implanting apparatus
KR20040070731A Front loading type reticle system
KR20040070813A Wafer alignment method by using image processing
KR20040070703A Isolation method in a semiconductor manufacturing device
KR20040070582A Spin rinse drier
KR20040070756A Gas scrubber device for semiconductor process
KR20040070589A Exhauster of the cleaning system of a chemical-mechanical polisher
KR20040070810A Bake unit for semiconductor track system and operating method therefor
KR20040070600A Spin rinse dry apparatus
KR20040070678A Threshold voltage numerical analysis method for sonos erase in semiconductor
KR20040070674A Method for monitoring particle in etch device
KR20040070742A Method for displaying shot size in reticle ppd check
KR20040070610A Trap device
KR20040070743A Particle remover for the bare reticle stocker