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ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH

Overview
  • Total Patents
    62
  • GoodIP Patent Rank
    29,134
  • Filing trend
    ⇧ 275.0%
About

ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH has a total of 62 patent applications. It increased the IP activity by 275.0%. Its first patent ever was published in 2003. It filed its patents most often in United States, Japan and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, optics and measurement are ICT INTEGRATED CIRCUIT TESTING GES FUR HALBLEITERPRUFTECHNIK MBH, BRUKER BIOSCIENCES PTY LTD and ERICH F HUTH G M B H FA DR.

Patent filings per year

Chart showing ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Winkler Dieter 24
#2 Cook Benjamin John 13
#3 Frosien Jürgen 9
#4 Adamec Pavel 7
#5 Lanio Stefan 6
#6 Breuer John 6
#7 Stefan Lanio 4
#8 Firnkes Matthias 4
#9 Jasinski Thomas 3
#10 Frosien Juergen 3

Latest patents

Publication Filing date Title
US10861666B1 Method of operating a charged particle gun, charged particle gun, and charged particle beam device
US10923313B1 Charged particle beam device and method of operating a charged particle beam device
US2020381208A1 Charged particle beam device, objective lens module, electrode device, and method of inspecting a specimen
US2020303156A1 Beam splitter for a charged particle device
US2020203116A1 Charged particle beam device, interchangeable multi-aperture arrangement for a charged particle beam device, and method for operating a charged particle beam device
US2020126751A1 Charged particle beam device, field curvature corrector, and methods of operating a charged particle beam device
US10483080B1 Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device
US2020027687A1 Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device
US10504684B1 High performance inspection scanning electron microscope device and method of operating the same
US2019259563A1 Device and method for forming a plurality of charged particle beamlets
US2019066972A1 Charged particle beam device, aperture arrangement for a charged particle beam device, and method for operating a charged particle beam device
US2019019649A1 Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device
US10176965B1 Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets
US2017263413A1 Multi-beam lens device, charged particle beam device, and method of operating a multi-beam lens device
US2017018402A1 Method of reducing coma and chromatic aberration in a charged particle beam device, and charged particle beam device
US2017003235A1 System and method for imaging a secondary charged particle beam with adaptive secondary charged particle optics
EP2879155A1 Multi-beam system for high throughput EBI
EP2827136A1 Switchable multi perspective detector, optics therefore and method of operating thereof
EP1916695A1 Charged particle beam apparatus and method for operating it
EP1777730A1 Arrangement and method for compensating emitter tip vibrations