Learn more

ACUID CORP LTD

Overview
  • Total Patents
    20
About

ACUID CORP LTD has a total of 20 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United States, EPO (European Patent Office) and United Kingdom. Its main competitors in its focus markets computer technology, digital networks and basic communication technologies are ABROSIMOV IGOR ANATOLIEVICH, M31 TECHNOLOGY CORP and ZERBE JARED L.

Patent filings in countries

World map showing ACUID CORP LTDs patent filings in countries

Patent filings per year

Chart showing ACUID CORP LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Deas Alexander Roger 12
#2 Abrosimov Igor Anatolievich 7
#3 Atyunin Vasily Grigorievich 6
#4 Vilkov Boris Nikolaevich 2
#5 Klochkov Iliya Valeryevich 1
#6 Davidov Vladimir Nikolayevich 1
#7 Mustafina Ekaterina Nikolaevna 1
#8 Demidov Vadim Sergeyevich 1

Latest patents

Publication Filing date Title
GB0216453D0 High speed interface device
US2002196061A1 Programmable self-calibrating vernier and method
EP1396126A2 Method and apparatus for impedance matching in a transmission line
GB0208014D0 Line termination incorporating compensation for device and package parasites
GB0202366D0 Means of reducing threshold offset caused by sending data at rates above the channel bandwidth
GB0131100D0 Receiver with automatic skew compensation
EP1370923A2 Channel time calibration means
EP1360569A2 Timing control means for automatic compensation of timing uncertainties
GB0026849D0 DDR SDRAM memory test system with fault strobe synchronization
US6460152B1 High speed memory test system with intermediate storage buffer and method of testing
US6712630B1 Pressure actuated zero insertion force socket
US6366995B1 System and a method for defining transforms of memory device addresses
TW452906B A skew calibration means and a method of skew calibration
US6393543B1 System and a method for transformation of memory device addresses
EP1040358A2 A memory test system with a means for test sequence optimisation and a method of its operation
US6269455B1 System and a method for processing information about locations of defective memory cells and a memory test with defect compression means