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YOKOGAWA ANALYTICAL SYS KK

Overview
  • Total Patents
    53
About

YOKOGAWA ANALYTICAL SYS KK has a total of 53 patent applications. Its first patent ever was published in 1993. It filed its patents most often in Japan. Its main competitors in its focus markets electrical machinery and energy and measurement are KORE TECH LTD, IONOPTIKA LTD and SHIMADZU RES LABORATORY SHANGHAI CO LTD.

Patent filings in countries

World map showing YOKOGAWA ANALYTICAL SYS KKs patent filings in countries
# Country Total Patents
#1 Japan 53

Patent filings per year

Chart showing YOKOGAWA ANALYTICAL SYS KKs patent filings per year from 1900 to 2020

Focus industries

Focus technologies

Top inventors

# Name Total Patents
#1 Inoue Yoshinori 9
#2 Inomata Tamotsu 8
#3 Sakata Kenichi 6
#4 Kumagai Hiroki 6
#5 Morioka Akihiro 5
#6 Yamanaka Kazuo 5
#7 Hanaoka Yuzuru 5
#8 Sugiyama Naoki 4
#9 Takahashi Yozo 4
#10 Aoyama Tetsuya 4

Latest patents

Publication Filing date Title
JPH1186779A Time-of-flight mass spectrometer using high-frequency inductively coupled plasma
JPH1140100A High-frequency induction coupled plasma spectrograph
JPH1140098A Induction coupled plasma mass spectrograph
JPH116788A Method and device for automatic preparation of solution
JPH10289687A Time of flight type mass spectrograph
JPH10289685A Inductively coupled plasma mass spectrograph
JPH10283984A Flight time type mass spectrograph
JPH10274641A Nebulizer
JPH10188881A Time of flight type mass spectrometry device and convergent lens for ion beam
JPH10188877A Inductively coupled plasma mass spectrometry device
JPH1097838A Mass-spectrometer for inductively coupled plasma
JPH1038808A Sample liquid atomization introducing device
JPH1040859A Scanning type mass spectrometer
JPH1040857A Inductively coupled plasma mass analyzing device
JPH09325130A Method for analyzing anionic compound
JPH09318609A Switching device for gas analyzer
JPH09257779A Method and apparatus for analyzing very small amount of anion
JPH09257777A Method and apparatus for analyzing soluble component in gas
JPH09236589A Method and device for analyzing low concentration gas component
JPH09196828A Changeover device for gas analyzing device