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XRADIA INC

Overview
  • Total Patents
    46
About

XRADIA INC has a total of 46 patent applications. Its first patent ever was published in 2002. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets measurement, engines, pumps and turbines and optics are X RAY OPTICAL SYS INC, XENOCS and CHAKRAVARTY SWAPNAJIT.

Patent filings per year

Chart showing XRADIA INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yun Wenbing 44
#2 Wang Yuxin 31
#3 Feser Michael 12
#4 Nill Kenneth W 12
#5 Scott David Dean 6
#6 Trapp David R 5
#7 Duewer Frederick William 4
#8 Lyon Alan Francis 3
#9 Duewer Frederick W 3
#10 Tkachuk Andrei 3

Latest patents

Publication Filing date Title
US8737565B1 Compound x-ray lens having multiple aligned zone plates
US8353628B1 Method and system for tomographic projection correction
US7974379B1 Metrology and registration system and method for laminography and tomography
US7787588B1 System and method for quantitative reconstruction of Zernike phase-contrast images
US7796725B1 Mechanism for switching sources in x-ray microscope
US2008273662A1 CD-GISAXS system and method
US2008309276A1 Five axis compensated rotating stage
US2008192347A1 High aspect-ratio X-ray diffractive structure stabilization methods and systems
US2008165924A1 System and method for fuel cell material x-ray analysis
US7443953B1 Structured anode X-ray source for X-ray microscopy
US7406151B1 X-ray microscope with microfocus source and Wolter condenser
US2007108387A1 Tunable x-ray fluorescence imager for multi-element analysis
US7412024B1 X-ray mammography
US7365918B1 Fast x-ray lenses and fabrication method therefor
US7095822B1 Near-field X-ray fluorescence microprobe
WO2006010091A2 Copper metallization analysis system and method using x-ray fluorescence
US2005282300A1 Back-end-of-line metallization inspection and metrology microscopy system and method using x-ray fluorescence
US7215736B1 X-ray micro-tomography system optimized for high resolution, throughput, image quality
US7130375B1 High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
US2005226376A1 Dual-band detector system for x-ray imaging of biological samples