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UTECHSYSTEM CO LTD

Overview
  • Total Patents
    21
  • GoodIP Patent Rank
    215,552
About

UTECHSYSTEM CO LTD has a total of 21 patent applications. Its first patent ever was published in 2005. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, semiconductors and electrical machinery and energy are KOKUSAI SYST SCI KK, NIPPON ELECTRO SENSARI DEVICE and WITHTECH INC.

Patent filings in countries

World map showing UTECHSYSTEM CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 21

Patent filings per year

Chart showing UTECHSYSTEM CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kim Je Sung 12
#2 Moon Youn Jae 5
#3 Jang Nam Kyou 5
#4 Chu Yeon Sung 3
#5 Lee Yu Jung 3
#6 Lim Ki Sang 2
#7 Hyun Sang Jun 2
#8 Yoo Seung Oh 1
#9 Park Jae Hong 1
#10 Lee Yu Jeng 1

Latest patents

Publication Filing date Title
KR20150088225A Device for Inspecting Melted State of Flat Cable
KR20150001706A System for Inspecting and Classifying Sapphire Wafers
KR20150069144A Method for Inspecting Lead Frame of LED
KR20150069141A Apparatus for Inspecting Lead Frame of LED
KR101511757B1 Inspecting apparatus for welding state of wire
KR20150066293A Soldering apparatus
KR20150061742A Apparatus for Measuring Horizontal Degree of Mounter In Process Chamber and Process Chamber the Same
KR20150052605A Device for Inspecting Melted State of Flat Cable
KR20140028831A Method for inspecting sapphire wafer
KR20140028834A System for inspecting and classifying sapphire wafers
KR101347689B1 Structure of apparatus for inspecting sapphire wafer
KR101347683B1 Apparatus for inspecting sapphire wafer
KR20140008593A Circuit for detecting connection
KR101305299B1 Structure of duct for arranging a plural of electrical elements or electronic elements
KR101257754B1 Structure of connection of open and shut between front door and rear door
KR101282757B1 Scan inspection apparatus and scan inspection method for glass edge
KR20120031594A Power distributor for manufacturing equipment of semiconductor and display device
KR101053924B1 Manufacturing methode of connector for power distributing
KR101047878B1 Probe equipment for solar cell
KR101094317B1 Apparatus for detecting mounter level of vacuum chamber