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TRAINER MICHAEL

Overview
  • Total Patents
    25
  • GoodIP Patent Rank
    175,443
  • Filing trend
    0.0%
About

TRAINER MICHAEL has a total of 25 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2005. It filed its patents most often in United States, Japan and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement and optics are AGFA NDT GMBH, JMAR TECHNOLOGIES INC and PHYS CHEMICAL RESEARCH CORP.

Patent filings in countries

World map showing TRAINER MICHAELs patent filings in countries

Patent filings per year

Chart showing TRAINER MICHAELs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement
#2 Optics

Top inventors

# Name Total Patents
#1 Trainer Michael 25

Latest patents

Publication Filing date Title
US2020025665A1 Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light
US2018188148A1 Method and apparatus for combining measurements of particle characteristics using light scattering and optical imaging
US2017322133A1 Methods and apparatus for determining particle characteristics by utilizing force on particles
US2016202164A1 Methods and apparatus for determining characteristics of particles from scattered light
US2014226158A1 Methods and apparatus for determining particle characteristics
US2014152986A1 Methods and apparatus for determining characteristics of particles
US2010225913A1 Methods and apparatus for determining characteristics of particles
US2010231909A1 Methods and apparatus for determining particle characteristics by measuring scattered light
US2008218738A1 Methods and apparatus for determining particle characteristics by measuring scattered light
US2008221814A1 Methods and apparatus for determining particle characteristics by measuring scattered light
US2008204716A1 Methods and apparatus for determining characteristics of particles
US2007242269A1 Methods and apparatus for determining characteristics of particles
US2007206203A1 Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered Light
WO2005091970A2 Methods and apparatus for determining the size and shape of particles