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THE FIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECH

Overview
  • Total Patents
    48
  • GoodIP Patent Rank
    31,224
About

THE FIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECH has a total of 48 patent applications. Its first patent ever was published in 2015. It filed its patents most often in China. Its main competitors in its focus markets measurement, computer technology and semiconductors are RIGOL TECHNOLOGIES INC, NOKOMIS INC and FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH.

Patent filings in countries

World map showing THE FIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECHs patent filings in countries
# Country Total Patents
#1 China 48

Patent filings per year

Chart showing THE FIFTH ELECTRONICS RES INST OF MINI OF IND AND INFORMATION TECHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 En Yunfei 22
#2 Huang Yun 14
#3 Chen Yiqiang 9
#4 Lei Dengyun 7
#5 Lei Zhifeng 7
#6 Zhu Junhua 6
#7 Fang Wenxiao 6
#8 Hou Bo 6
#9 He Chunhua 6
#10 Zhang Zhangang 5

Latest patents

Publication Filing date Title
CN106354692A On-chip TDDB (time dependent dielectric breakdown) degradation monitoring and failure warning circuit facing SoC (system on chip)
CN106323373A Electronic equipment health monitoring and early warning system and electronic equipment health monitoring and early warning method
CN106017866A Laser life test fixing clamp
CN106020170A Method, apparatus and system for SoC health monitoring
CN106124970A The fault filling method of SRAM type FPGA and device
CN106124953A Single particle effect Forecasting Methodology and device
CN106021036A Reconfigurable system fault analyzing method and device
CN106017834A Non-contact modality testing method, device, and system
CN105841907A Modal testing method, modal testing device and modal testing system of micro latticed shell structure
CN105954670A ESD failure early warning circuit of integrated circuit
CN105699149A Layer stripping method in chip failure analysis process
CN105868115A Building method and system for software test model of software intensive system
CN105842611A Flip chip detection sample preparation method
CN105893876A Chip hardware Trojan horse detection method and system
CN105759197A System and method for acquiring DDS device single event effect abnormal waveforms
CN105895163A Single event effect detection method and system based on image backup
CN105866653A Method and system for predicting single event effect in multiple sensitive regions
CN105787205A FMEA (failure mode and effects analysis) based graphic representation method and system for relation of failure modes and effects
CN105738224A Method for testing mechanical properties of electronic gun heater assembly
CN105606447A Clamp for testing tensile mechanical performance of heater assembly and testing device