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NISHIKAWA HIDEO

Overview
  • Total Patents
    18
  • GoodIP Patent Rank
    197,416
About

NISHIKAWA HIDEO has a total of 18 patent applications. Its first patent ever was published in 1974. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement are SPECTROSCOPY IMAGING SYSTEMS C, HITACHI ELECTRIC SYSTEMS and KRIZIK FRANZ.

Patent filings in countries

World map showing NISHIKAWA HIDEOs patent filings in countries

Patent filings per year

Chart showing NISHIKAWA HIDEOs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Focus technologies

Top inventors

# Name Total Patents
#1 Nishikawa Hideo 18

Latest patents

Publication Filing date Title
JP2020201283A Substrate inspection device, inspection tool, and substrate inspection method therefor
JP2020034418A Substrate inspection device, inspection tool, and substrate inspection method therefor
JP2019028077A Substrate inspection device, positioning, and substrate inspection method
JP2018200314A Board inspection device, inspection tool, and its relative alignment method
JP2015200602A Contact piece and inspection jig
JP2014163786A Contact piece and inspection jig
JP2014163765A Contactor and inspection jig
WO2012039226A1 Inspecting jig and contact
CN103026242A Inspection jig and contact
WO2012014673A1 Inspection jig and contact
JP2012073213A Checkup jig and contact piece
JP2012058129A Contactor and method of manufacturing the same
JP2012057995A Inspection tool and contactor
JP2012032315A Inspection tool and contact piece