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SPECTRO ANALYTICAL INSTR GMBH

Overview
  • Total Patents
    57
  • GoodIP Patent Rank
    107,814
  • Filing trend
    ⇧ 100.0%
About

SPECTRO ANALYTICAL INSTR GMBH has a total of 57 patent applications. It increased the IP activity by 100.0%. Its first patent ever was published in 1995. It filed its patents most often in Germany, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, electrical machinery and energy and chemical engineering are LEIBNIZ INST FUER ANALYTISCHE WISSENSCHAFTEN ISAS E V, ASPECTRICS INC and WESTCO SCIENT INSTRUMENTS INC.

Patent filings in countries

World map showing SPECTRO ANALYTICAL INSTR GMBHs patent filings in countries

Patent filings per year

Chart showing SPECTRO ANALYTICAL INSTR GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Bohle Wolfram 16
#2 Joosten Heinz-Gerd 13
#3 Ardelt Dirk 10
#4 Scheidemann Adi A 7
#5 Heynen Ulrich 7
#6 Neitsch Lutz 5
#7 Falk Heinz 4
#8 Joosten Heinz-Gerd Dr 3
#9 Neienhuis Markus 2
#10 Termanis Alexander 2

Latest patents

Publication Filing date Title
DE102019100290A1 Spectrometer with mechanical shutter
DE102018133042A1 Method and device for the calibration of spectrometers
DE102018129010A1 Arrangement for optical emission spectrometry with improved light output
DE102016013267A1 Method for compensating a spectrum drift in a spectrometer
DE102016005386A1 Optomechanically compensated spectrometer
DE102015002104A1 Energy efficient and inherently safe excitation generator
WO2016101984A1 Grating spectrometer with an improved resolution
WO2016101986A1 Grid spectrometer having a switchable light path
US2017343478A1 Optical emission spectroscope with a pivotably mounted inductively coupled plasma source
US2014312219A1 Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry
DE102012015584A1 Silicon photomultiplier (SiPM) and optical emission spectrometer provided therewith
EP2568276A1 Plasma emission transfer and modification device
DE102010056152A1 Simultaneous inorganic mass spectrometer and inorganic mass spectrometry method
DE102010008839A1 Method for the determination of carbon in cast iron
DE102007027008A1 Spectrometers with solid state sensors and secondary electron multipliers
DE102007027010A1 Spectrometer optics with non-spherical mirrors
US2009014635A1 Method for correcting spectral interference in ICP emission spectroscopy (OES)
US2007176089A1 Apparatus for detecting particles
DE102006004478A1 Device for detecting particles for a mass spectrometer comprises trenches arranged between neighboring structures in the radiation direction
DE102005058160A1 Atom fluorescence spectrometer e.g. spark emission spectrometer, for analyzing metallic samples, has spark generator producing plasmas in area between electrode and sample surface, and radiation source producing fluorescence radiation