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X RITE INC

Overview
  • Total Patents
    175
  • GoodIP Patent Rank
    188,100
  • Filing trend
    0.0%
About

X RITE INC has a total of 175 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 1990. It filed its patents most often in United States, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, computer technology and audio-visual technology are ASPECTRICS INC, VERIFOOD LTD and MAXMEYER DUCO MM D SPA.

Patent filings per year

Chart showing X RITE INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Berg Bernard J 46
#2 Baker Douglas V 41
#3 Overbeck James L 32
#4 Cargill Mark A 26
#5 Peterson Steven H 19
#6 Bowden David R 17
#7 Van Andel Richard J 17
#8 Friend Timothy R 16
#9 Boes Thomas J 13
#10 Richardson Thomas M 12

Latest patents

Publication Filing date Title
EP3812978A1 Delta e formula match prediction
EP3639237A1 Hyperspectral imaging spectrophotometer and system
EP3134757A1 Targeting system
EP2632143A2 Systems and methods for facilitating reproduction of arbitrary colors
EP2284512A1 Improved optical assemblies for low cost spectral imaging with high spectral resolution
EP2242018A2 Systems and methods for imaging of latent image plates
EP2163869A2 Point-of-purchase (POP) spectrophotometer for open-view measurement of a color sample
US2009213120A1 Method and system for enhanced formulation and visualization rendering
EP2104923A2 Surface appearance simulation
US2009097028A1 Color measurement systems and methods addressing effects of ultra-violet light
US2008074667A1 Color measurement instrument
US2009066631A1 Backlight control system and method using dither sampling
US2009027673A1 Color measurement device with error detection
US2009021737A1 Color management system with system-level communications
EP2169368A2 Industrially robust non-contact color measurement device
US2007291993A1 Measuring an appearance property of a surface using a bidirectional reflectance distribution function
EP1850099A1 Calibration of electro-optical instrumentation within printing devices
US2008069500A1 Fiber optic overmold method and product
EP1934653A2 Devices and methods for targeting printing plates and measuring dot coverage thereon
EP1938063A2 Spectrophotometer with light guiding element