SIGMA KOKI CO LTD has a total of 20 patent applications. Its first patent ever was published in 1995. It filed its patents most often in Japan, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets optics, measurement and textiles and paper are KAPELLA LTD, PLX INC and DOWNS MICHAEL JOHN.
# | Country | Total Patents | |
---|---|---|---|
#1 | Japan | 5 | |
#2 | United States | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 4 | |
#4 | Australia | 2 | |
#5 | China | 2 | |
#6 | EPO (European Patent Office) | 2 | |
#7 | Republic of Korea | 1 |
# | Industry | |
---|---|---|
#1 | Optics | |
#2 | Measurement | |
#3 | Textiles and paper | |
#4 | Materials and metallurgy | |
#5 | Surface technology and coating | |
#6 | Machine tools | |
#7 | Mechanical elements |
# | Technology | |
---|---|---|
#1 | Optical systems | |
#2 | Typewriters | |
#3 | Measuring length, angles and areas | |
#4 | Treatment of glass | |
#5 | Layered products | |
#6 | Shafts | |
#7 | Metalworking with concentrated electric current | |
#8 | Accessories for machine tools |
# | Name | Total Patents |
---|---|---|
#1 | Inoue Asami | 4 |
#2 | Ito Daisuke | 4 |
#3 | Sakamoto Shigeru | 4 |
#4 | Osada Hidenori | 4 |
#5 | Hirata Kazuya | 4 |
#6 | Tanaka Kenji | 4 |
#7 | Haraguchi Koshi | 3 |
#8 | Aoshima Toshiaki | 3 |
#9 | Yachi Hideo | 3 |
#10 | Haraguchi Yasushi | 3 |
Publication | Filing date | Title |
---|---|---|
JP2014066615A | Electrooptical coefficient measuring method and electrooptical coefficient measuring apparatus | |
JP2014025793A | Method and apparatus for evaluating crystalline samples | |
KR20120088749A | Plate-type broadband depolarizing beam splitter | |
JP2012002616A | Optical element and interferometer | |
JP2011242211A | Phase difference measuring device | |
JP2011226966A | Measurement method and measurement device | |
AU3707897A | Pattern transfer method and apparatus, transfer medium and braille printer | |
AU3707997A | Projecting pattern forming method and apparatus, and projecting pattern forming medium |