SHINANO ELECTRONICS KK has a total of 13 patent applications. Its first patent ever was published in 1996. It filed its patents most often in Japan, EPO (European Patent Office) and United States. Its main competitors in its focus markets measurement, audio-visual technology and semiconductors are TOYO DENSHI GIKEN KK, SEMCNS CO LTD and PFAFF WAYNE.
# | Country | Total Patents | |
---|---|---|---|
#1 | Japan | 10 | |
#2 | EPO (European Patent Office) | 1 | |
#3 | United States | 1 | |
#4 | WIPO (World Intellectual Property Organization) | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Audio-visual technology | |
#3 | Semiconductors |
# | Technology | |
---|---|---|
#1 | Measuring electric variables | |
#2 | Casings and printed circuits | |
#3 | Semiconductor devices |
# | Name | Total Patents |
---|---|---|
#1 | Ito Masato | 6 |
#2 | Nishihara Yutaka | 3 |
#3 | Tanaka Kimihiko | 1 |
#4 | Nakamura Satoshi | 1 |
#5 | Imai Akio | 1 |
#6 | Tsurumi Keiji | 1 |
#7 | Tsurumi Yoshiji | 1 |
#8 | Koizumi Mitsuo | 1 |
#9 | Shinozaki Masami | 1 |
#10 | Tokumaru Takashi | 1 |
Publication | Filing date | Title |
---|---|---|
JP2012078310A | Ic handler and ic inspection apparatus | |
JP2011191068A | Conveyance device of ic device | |
JP2010159988A | Temperature control device for low-temperature test of ic | |
JP2005183760A | Transfer, ic test handler and component packaging machine | |
JP2004184173A | Integrated circuit (ic) test handler | |
JP2003028918A | Handling equipment for testing electronic component, ic test handler, and pump for liquid nitrogen | |
JP2001341090A | Vacuum gripping device and ic test handler | |
JP2000193716A | Ic test handler | |
JP2000137055A | Ic handler | |
JP2000028681A | Ic test handler | |
WO9724913A1 | Method of positioning ic and ic handler using the same |