Learn more

SHANGHAI YUWEI SEMICONDUCTOR TECH CO LTD

Overview
  • Total Patents
    18
  • GoodIP Patent Rank
    90,754
About

SHANGHAI YUWEI SEMICONDUCTOR TECH CO LTD has a total of 18 patent applications. Its first patent ever was published in 2019. It filed its patents most often in China. Its main competitors in its focus markets measurement, optics and computer technology are PARTICLE METRIX GMBH, MANTA INSTR INC and OPTOFLUIDICS INC.

Patent filings in countries

World map showing SHANGHAI YUWEI SEMICONDUCTOR TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 18

Patent filings per year

Chart showing SHANGHAI YUWEI SEMICONDUCTOR TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yang Chaoxing 4
#2 Chen Chuangchuang 4
#3 Yu Kaihang 3
#4 Wang Bingbing 3
#5 Gao Jianxiang 2
#6 Zhao He 1
#7 Zhang Pengli 1

Latest patents

Publication Filing date Title
CN112285116A Defect detection device and method
CN111551556A Defect detection device and defect detection method
CN111521617A Optical detection apparatus, control method of optical detection apparatus, and storage medium
CN111239164A Defect detection device and method thereof
CN111220621A Chip inclined surface detection method
CN111252536A Material conveying device
CN111208144A Defect detection system and defect detection method
CN111239996A Microscope objective and automatic optical detection system
CN111207671A Position calibration method and position calibration device
CN111158219A Device and method for defect detection and particle removal of mask plate
CN110736751A surface defect detection method and device
CN110648323A Defect detection classification system and method thereof
CN110531493A A kind of lens system and line sweep machine visual lens
CN110441234A A kind of zoom cylinder mirror, defect detecting device and defect inspection method
CN110441233A A kind of magnetcisuspension suspension workpiece table and defect detecting device
CN110308152A A kind of optical detection apparatus and optical detecting method
CN110286134A A kind of defect detecting device and its method
CN110286130A A kind of defect detecting device and its method