| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 8 | |
| #2 | Republic of Korea | 3 | |
| #3 | WIPO (World Intellectual Property Organization) | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Optics | |
| #4 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Image data processing | |
| #3 | Optical systems | |
| #4 | Data recognition and presentation | |
| #5 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Silberstein Shai | 7 |
| #2 | Furman Dov | 5 |
| #3 | Neumann Gad | 4 |
| #4 | Dotan Noam | 4 |
| #5 | Avni Tsafrir | 3 |
| #6 | Wagner Mark | 2 |
| #7 | Segal Ram | 2 |
| #8 | Cohen Oren | 2 |
| #9 | Sali Erez | 2 |
| #10 | Wong Loke Yuen | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2014168578A1 | Wafer bonding total thickness variation improvement by contour confinement method | |
| US2009323052A1 | Dynamic illumination in optical inspection systems | |
| US2009323053A1 | Optical inspection tools featuring light shaping diffusers | |
| US2008307908A1 | Optical inspection including partial scanning of wafers | |
| US2008181484A1 | Advanced cell-to-cell inspection | |
| US2007247668A1 | Printed fourier filtering in optical inspection tools |