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JPH10199291A
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Memory having redundant memory cell and testing method of redundant memory cell
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JPH10208496A
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Method and circuit for selecting signal
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JPH10188595A
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Circuit and method for replacing defective memory cell with redundant memory cell
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JPH10116865A
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Integrated circuit die suitable for wafer level testing and its manufacture
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JPH10125745A
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Integrated circuit and method for supporting wafer level tests
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JPH10125804A
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Structure for transistor device in sram cell
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