| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 5 | |
| #2 | EPO (European Patent Office) | 4 | |
| #3 | WIPO (World Intellectual Property Organization) | 4 | |
| #4 | Brazil | 2 | |
| #5 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Control | |
| #4 | Basic communication technologies | |
| #5 | Machines |
| # | Name | Total Patents |
|---|---|---|
| #1 | Leuschner Horst | 12 |
| #2 | Dunn William C | 3 |
| #3 | Rossetti Nazzareno | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US4755750A | Wafer keys for wafer probe alignment | |
| US4717845A | TTL compatible CMOS input circuit | |
| BR8606541A | Perfected input protection network to reduce the effect of damage from an electrostatic discharge at least one electric door input of a mos semiconductor chip | |
| EP0220233A1 | Target keys for wafer probe alignment. | |
| US4628247A | Voltage regulator | |
| US4628214A | Back bias generator |