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DE19800844A1
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Method for wave front measurement using Shack-Hartmann sensor
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Object illumination method with sinusoidal intensity distributions
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Measuring surfaces using illumination of white light microscope with spectral lamp
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Parallel micro-optical star coupler for data communications
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Dynamic range increasing method for measurement through Shack-Hartmann sensor
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Automated phase division evaluation method for interferometer, used, e.g., in CCD array
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Process for the interferometric testing of technical surfaces
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Confocal microscopy method using refractive microlens fields
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Planar wavefront aberration measuring method for coherent light source in gitter shear interferometer
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Computer generated diffraction masks for examining surfaces
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Surface interferometric test for opaque or transparent objects
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