| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 5 | |
| #2 | WIPO (World Intellectual Property Organization) | 3 | |
| #3 | Australia | 1 | |
| #4 | United Kingdom | 1 | |
| #5 | Japan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Wagner Jeff A | 4 |
| #2 | Wagner Jeff | 4 |
| #3 | Thomas Bancroft G | 3 |
| #4 | Jeff Wagner A | 3 |
| #5 | Bancroft Thomas G | 2 |
| Publication | Filing date | Title |
|---|---|---|
| WO2012134850A1 | Critical-angle refractometry | |
| US2011149282A1 | Polarimeter and Polarimetry Method | |
| US2007289376A1 | Oscillatory measurement device with visual recorder | |
| US2007289377A1 | Method and apparatus for oscillating a test sample | |
| US6717665B2 | Polarimeter |