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NIPPON X RAY KK

Overview
  • Total Patents
    22
About

NIPPON X RAY KK has a total of 22 patent applications. Its first patent ever was published in 1975. It filed its patents most often in Japan. Its main competitors in its focus markets measurement are AKTSIONERNOE OBSHCHESTVO ZAP S, LI YISHAN and VNII GIGIENY TOKSIKOLOGII PEST.

Patent filings in countries

World map showing NIPPON X RAY KKs patent filings in countries
# Country Total Patents
#1 Japan 22

Patent filings per year

Chart showing NIPPON X RAY KKs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Focus technologies

# Technology
#1 Analysing materials

Top inventors

# Name Total Patents
#1 Kawatsu Kiyoshi 5
#2 Isa Akiyoshi 3
#3 Takahashi Akisuke 3
#4 Uematsu Hideaki 3
#5 Kondou Masashi 2
#6 Oodate Katsuyoshi 2
#7 Komatsubara Takao 2
#8 Saida Fumihito 2
#9 Koseki Masahito 2
#10 Miura Hitoshi 2

Latest patents

Publication Filing date Title
JPH04286946A Multipurpose x-ray diffraction goniometer
JPH03159050A Bent-type one-dimensional position sensitive proportional counter and manufacture of its cathode pattern
JPH03159051A Bent-type one-dimensional position sensitive proportional counter and jig for extending its anode core
JPH0359936A Rotating couple cathode x-ray generator
JPH0359934A Rotating couple cathode
JPH0359935A Motor direct-coupled type rotating couple cathode
JPH0342561A Automatic temperature control type x-ray diffraction apparatus
JPH02253143A X-ray diffraction device
JPH02197098A X-ray generator provided with water leak detection means
JPH0247600A Collimator
JPH0224940A Rotary x-ray generating device of counter-cathode type
JPH01114742A Peak detecting method for x-ray spectrum
JPS63191950A Peak position detecting method for spectrum signal
JPS63148119A Recording system for analyzed spectrum
JPS63127180A X-ray analyser
JPS5710440A X-ray diffraction goniometer
JPS55163444A X-ray analyzing device
JPS5599050A Xxray spectroscope
JPS5560843A Minute region x-ray diffractometer
JPS5439659A Method of measuring thickness by radiation and its device