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QUALITAU INC

Overview
  • Total Patents
    120
  • GoodIP Patent Rank
    45,520
  • Filing trend
    ⇧ 40.0%
About

QUALITAU INC has a total of 120 patent applications. It increased the IP activity by 40.0%. Its first patent ever was published in 1997. It filed its patents most often in United States, China and Taiwan. Its main competitors in its focus markets measurement, electrical machinery and energy and machines are XCERRA CORP, LEENO IND INC and PAK SANG YANG.

Patent filings per year

Chart showing QUALITAU INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Ullmann Jens 33
#2 Cuevas Peter P 22
#3 Borthwick James 22
#4 Ramirez Adalberto M 19
#5 Herschmann Jacob 18
#6 Krieger Gedaliahoo 18
#7 Anderson Michael L 17
#8 Mostarshed Shahriar 15
#9 Mccloud Edward A 13
#10 Evans Maurice C 13

Latest patents

Publication Filing date Title
CN110662974A Signal distribution device
WO2018119004A1 Universal probing assembly with five degrees of freedom
US2017131327A1 Pulsed current source with internal impedance matching
US2016187377A1 Semi-automatic prober
US2017131326A1 Pulsed current source with internal impedance matching
US2014269822A1 Wafer temperature measurement tool
US2010201389A1 Integrated unit for electrical/reliability testing with improved thermal control
US2010052633A1 Modified current source (MCS) with seamless range switching
US7598760B1 High temperature ceramic die package and DUT board socket
US2009206869A1 Electromigration tester for high capacity and high current
US7429856B1 Voltage source measurement unit with minimized common mode errors
US2008315900A1 High temperature ceramic socket configured to test packaged semiconductor devices
US2008315862A1 Smart parallel controller for semiconductor experiments
US2008238451A1 Automatic multiplexing system for automated wafer testing
US7172450B1 High temperature open ended zero insertion force (ZIF) test socket
US2007103176A1 Semi-automatic multiplexing system for automated semiconductor wafer testing
US7126361B1 Vertical probe card and air cooled probe head system
WO2005089421A2 Electrical connector for semiconductor device test fixture and test assembly
US2005194963A1 Dual channel source measurement unit for semiconductor device testing
US2005206367A1 Automatic range finder for electric current testing