QCEPT TECHNOLOGIES INC innovation strategy

Patent filings in countries

#	Country	Total Patents
#1	United States	12
#2	EPO (European Patent Office)	7
#3	Taiwan	7
#4	WIPO (World Intellectual Property Organization)	6
#5	Republic of Korea	5
#6	China	4
#7	Japan	1

#	Technology
#1	Analysing materials
#2	Measuring electric variables
#3	Semiconductor devices
#4	Scanning-probe techniques
#5	Image data processing
#6	Measuring mechanical vibrations

Publication	Filing date	Title
TW201602571A	2015-05-18	Work function calibration of a non-contact voltage sensor
EP2394294A2	2010-01-26	Patterned wafer inspection system using a non-vibrating contact potential difference sensor
US2009276176A1	2008-05-02	Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion
US2009139312A1	2007-11-30	Defect classification utilizing data from a non-vibrating contact potential difference sensor
US2008217530A1	2007-03-07	Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
US2005162178A1	2005-03-11	Inspection system and apparatus
US7103482B2	2004-08-05	Inspection system and apparatus
US2005016279A1	2004-07-23	Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor
US2004241890A1	2004-02-03	Wafer inspection system
US2004152250A1	2003-07-29	Semiconductor wafer inspection system