| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 6 | |
| #2 | EPO (European Patent Office) | 4 | |
| #3 | United States | 4 | |
| #4 | China | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology | |
| #3 | Machine tools |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kakuda Yoshihisa | 13 |
| #2 | Nakashima Tsutomu | 6 |
| #3 | Yoshihisa Kakuda | 3 |
| #4 | Muramatsu Hirokatsu | 1 |
| #5 | Tsutomu Nakashima | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2008081939A1 | Laser reflow device | |
| WO2008035765A1 | Inspecting apparatus | |
| WO2008026559A1 | Substrate inspecting apparatus | |
| WO2008026562A1 | Board appearance inspection method and device | |
| EP2056064A1 | Inspecting apparatus, and inspecting method |