Learn more

PHOTONIC LATTICE INC

Overview
  • Total Patents
    50
  • GoodIP Patent Rank
    212,041
About

PHOTONIC LATTICE INC has a total of 50 patent applications. Its first patent ever was published in 2003. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets optics, measurement and computer technology are ZEISS CARL MICROIMAGING GMBH, LEICA MICROSYSTEMS and VENKATESAN VARUN AKUR.

Patent filings in countries

World map showing PHOTONIC LATTICE INCs patent filings in countries

Patent filings per year

Chart showing PHOTONIC LATTICE INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kawakami Shojiro 44
#2 Sato Takashi 24
#3 Kawashima Takayuki 18
#4 Inoue Yoshihiko 11
#5 Chiba Takashi 8
#6 Odera Yasuo 7
#7 Hashimoto Naoki 7
#8 Okubo Hiroyuki 6
#9 Honma Hiroshi 5
#10 Aoyama Tsutomu 4

Latest patents

Publication Filing date Title
JP2017156557A Phase plate, lens, and polarization separating element
WO2016060263A1 Integrated optical coupler having polarization separation/synthesis function
WO2014129444A1 Light-emitting element with high light extraction efficiency for internal light emission and substrate for light-emitting element
JP2015007725A Optical imaging device
JP2013257371A Photonic crystal element having polarization conversion function
JP2012181385A Polarization converter
JP2012093098A Film thickness measuring device
JP2011076049A Optical signal receiver
WO2009139133A1 Optical distortion measurement apparatus
WO2009107355A1 Self-cloning photonic crystal for ultraviolet light
JP2010156895A Polarizing diffraction element
JP2010156896A Multi-value wavelength plate
WO2008117528A1 Laser resonator and laser device having uneven polarization distribution
WO2008105156A1 Polarization imaging device and differential interference microscope
JP2009180635A Optical composite part and optical measurement device
JP2009156712A Polarization measuring device and measuring system
JP2009139356A Polarized light measuring device
JP2009139355A Defect inspection device
WO2008010316A1 Polarizer and microscope with polarizer
JP2008197399A Polarizing microscope and unit for same