| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 3 | |
| #2 | Republic of Korea | 3 | |
| #3 | Taiwan | 3 | |
| #4 | United States | 3 | |
| #5 | WIPO (World Intellectual Property Organization) | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lee Jaebok | 9 |
| #2 | Kang Hyun | 5 |
| #3 | Lee Jae Bok | 3 |
| #4 | Lee Jae-Bok | 3 |
| #5 | Kim Daewon | 3 |
| #6 | Im Yunchang | 3 |
| #7 | Hwang Deokha | 3 |
| #8 | Park Jaehoon | 3 |
| #9 | Hwang Deok-Ha | 1 |
| #10 | Im Yun-Chang | 1 |
| Publication | Filing date | Title |
|---|---|---|
| KR101845652B1 | Hybrid probe card for component mounted wafer test | |
| KR20180079934A | Vertical ultra-low leakage current probe card for dc parameter test | |
| KR20180075834A | Straight needle probe card with adjustable probe force |