| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 12 | |
| #2 | WIPO (World Intellectual Property Organization) | 2 | |
| #3 | EPO (European Patent Office) | 1 | |
| #4 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Semiconductors | |
| #3 | Machines | |
| #4 | Micro-structure and nano-technology | |
| #5 | Measurement | |
| #6 | Surface technology and coating |
| # | Name | Total Patents |
|---|---|---|
| #1 | Bennahmias Mark Joseph | 14 |
| #2 | Zani Michael John | 14 |
| #3 | Scott Jeffrey Winfield | 13 |
| #4 | Mayse Mark Anthony | 11 |
| #5 | Bennahmias Mark | 2 |
| #6 | Zani Michael | 2 |
| #7 | Mayse Mark | 2 |
| #8 | Scott Jeffrey | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US2020035452A1 | Method and device for spatial charged particle bunching | |
| US2011167913A1 | Imaging devices for measuring the structure of a surface | |
| WO2010144730A2 | Method for manufacturing multi-component oxide heterostructures | |
| WO2008140585A1 | Apparatus and method for conformal mask manufacturing | |
| KR20080070619A | Apparatus and method for controlled particle beam manufacturing |