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NEC YAMAGUCHI LTD

Overview
  • Total Patents
    396
About

NEC YAMAGUCHI LTD has a total of 396 patent applications. Its first patent ever was published in 1987. It filed its patents most often in Japan. Its main competitors in its focus markets semiconductors, environmental technology and optics are MIYAZAKI OKI DENKI KK, HITACHI TOKYO ELECTRONICS and WANG HONGREN.

Patent filings in countries

World map showing NEC YAMAGUCHI LTDs patent filings in countries
# Country Total Patents
#1 Japan 396

Patent filings per year

Chart showing NEC YAMAGUCHI LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Ishihara Kaoru 10
#2 Miyazaki Mitsuhiro 8
#3 Suzuki Takashi 7
#4 Sumo Hiroki 7
#5 Yoshida Hisanori 7
#6 Inoue Akihiko 7
#7 Oshita Chihiro 6
#8 Magota Masashi 6
#9 Kato Minoru 6
#10 Nagayasu Katsuyuki 6

Latest patents

Publication Filing date Title
JP2005350715A Component for thin film deposition system and its production method
JP2005340696A Position detection method of probe needle, semiconductor device and semiconductor inspection apparatus
JP2005326217A Temperature control system and semiconductor tester
JP2005277099A Semiconductor device and method of manufacturing the same
JP2004141803A Plasma process apparatus and its chamber seal method
JP2003036948A Connector
JP2003007949A Cutting/separating die for lead frame and cutting/ separating method therefor
JP2002343847A Wafer conveying apparatus
JP2002246342A Polishing device
JP2002134673A Lead molding equipment
JP2002131334A Probe needle, probe card, and manufacturing method of probe card
JP2002076147A Flash memory device
JP2002025495A Electron shower device for ion-implantation apparatus
JP2002016130A Impurity collecting jig
JP2002006008A Ic tester
JP2002002609A Packaging device for semiconductor device
JP2001345410A Metal die and method for forming lead
JP2001332486A Wafer-developing device
JP2001319843A Wafer edge aligner and exposing method
JP2001296329A Ic tester and board discrimination method in ic tester