NANOSCOPESYSTEMS INC has a total of 13 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets optics, measurement and electrical machinery and energy are JOBIN & YVON, ZEISS CARL MICROIMAGING GMBH and DMETRIX INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | Republic of Korea | 12 | |
#2 | WIPO (World Intellectual Property Organization) | 1 |
# | Industry | |
---|---|---|
#1 | Optics | |
#2 | Measurement | |
#3 | Electrical machinery and energy | |
#4 | Audio-visual technology | |
#5 | Computer technology | |
#6 | Semiconductors | |
#7 | Micro-structure and nano-technology |
# | Technology | |
---|---|---|
#1 | Optical systems | |
#2 | Analysing materials | |
#3 | Measuring light | |
#4 | Measuring length, angles and areas | |
#5 | Television | |
#6 | Electric discharge tubes | |
#7 | Electric digital data processing | |
#8 | Nonlinear optics | |
#9 | Microstructural devices | |
#10 | Semiconductor devices |
# | Name | Total Patents |
---|---|---|
#1 | Chun Byung Seon | 13 |
#2 | Lee Seung Woo | 11 |
#3 | Song In Cheon | 10 |
#4 | Kim Tae Joong | 6 |
#5 | Lee Seungwoo | 2 |
#6 | Song Incheon | 2 |
#7 | Kim Kyoung Chon | 1 |
#8 | Kang Dong Kyun | 1 |
#9 | Yoo Hong Ki | 1 |
#10 | Kim Hyo Young | 1 |
Publication | Filing date | Title |
---|---|---|
KR102043765B1 | Raman spectroscopy measuring multi samples | |
KR101965803B1 | Raman spectroscopy having laser power control apparatus | |
KR101872434B1 | Apparatus for thickness measurement | |
WO2017034297A1 | Curved turret | |
KR20170023692A | Curvilinear turret | |
KR20160017299A | Near infrared confocal line-scanning camera and confocal microscope comprising the same | |
KR101368486B1 | Wavelength detector using colo filter and high-speed chromatic confocal microscope having the wavelength detector | |
KR101181395B1 | Multiple detection confocal microscope | |
KR101119815B1 | Beam scanner | |
KR101032434B1 | Linear turret scanner | |
KR20110087418A | A stage using flexure hinge module | |
KR20100018984A | Beam scanning chromatic confocal microscopy | |
KR20080053558A | A 3-dimensional shape measuring system |