| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Australia | 4 | |
| #2 | EPO (European Patent Office) | 3 | |
| #3 | WIPO (World Intellectual Property Organization) | 3 | |
| #4 | Republic of Korea | 2 | |
| #5 | China | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Measuring length, angles and areas | |
| #2 | Photomechanical semiconductor production | |
| #3 | Optical systems |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kulawiec Andrew W | 10 |
| #2 | Tronolone Mark J | 8 |
| #3 | Dunn Thomas J | 4 |
| #4 | Lee Christopher A | 4 |
| #5 | Dewa Paul G | 2 |
| #6 | Bruning John H | 2 |
| #7 | Lindquist Dag | 2 |
| #8 | Webb James E | 2 |
| #9 | Platten James E | 2 |
| Publication | Filing date | Title |
|---|---|---|
| AU2003301582A8 | Two-wavelength confocal interferometer for measuring multiple surfaces |