LEO ELECTRON MICROSCOPY LTD has a total of 15 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United Kingdom, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy and basic communication technologies are REISZ EUGEN, NEC NETWORK & SENSOR SYSTEMS LTD and GRIFFITHS ELECTRONICS INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | United Kingdom | 7 | |
#2 | United States | 3 | |
#3 | WIPO (World Intellectual Property Organization) | 3 | |
#4 | EPO (European Patent Office) | 1 | |
#5 | Malaysia | 1 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Basic communication technologies |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Amplifiers | |
#3 | Amplification control |
# | Name | Total Patents |
---|---|---|
#1 | Hayn Armin Heinz | 4 |
#2 | Dean Michael Frank | 3 |
#3 | Martin Giles Adam Edward | 3 |
#4 | Sailer Rainer | 2 |
#5 | Bate David John | 2 |
#6 | Sudraud Pierre | 2 |
#7 | Corbin Antoine | 2 |
#8 | Armit Andrew Philip | 2 |
#9 | Antoine Corbin | 1 |
#10 | Pierre Sudraud | 1 |
Publication | Filing date | Title |
---|---|---|
GB0312288D0 | Improvements in or relating to particle detectors | |
GB0222328D0 | Improvements in and relating to the control of instruments | |
GB0212601D0 | Transresistance amplifier for a charged particle detector | |
GB0212629D0 | Improvements in or relating to particle detectors | |
GB0109704D0 | Scanning electron microscope | |
GB0019547D0 | Improvements in or relating to particle detectors | |
WO0106536A2 | Scanning beam instruments | |
MY128346A | Scanning electron microscope | |
GB9910896D0 | Scanning electron microscope |