| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 8 | |
| #2 | United States | 6 | |
| #3 | Japan | 5 | |
| #4 | United Kingdom | 3 | |
| #5 | Czechia | 1 | |
| #6 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Basic communication technologies | |
| #3 | Optics | |
| #4 | Control |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Optical systems | |
| #3 | Amplification control | |
| #4 | Amplifiers | |
| #5 | Control or regulating systems |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hayn Armin Heinz | 7 |
| #2 | Armit Andrew Philip | 5 |
| #3 | Stubbs Tim Robert | 4 |
| #4 | Spruck Bernd | 2 |
| #5 | Taylor Robert | 2 |
| #6 | Edelmann Martin | 2 |
| #7 | Martin Giles Adam Edward | 2 |
| #8 | Craven John | 2 |
| #9 | Kuehner Martin | 2 |
| #10 | Dean Michael Frank | 2 |
| Publication | Filing date | Title |
|---|---|---|
| JP2012099481A | Microscope system, and method for operating charged-particle microscope | |
| EP2061067A2 | Beam device and system comprising a particle beam device and an optical microscope | |
| EP2003526A1 | Method and device for controlling and monitoring a position of a holding element | |
| GB0618770D0 | Charged particle beam instrument and method of detecting charged particles | |
| GB0600577D0 | Charged particle beam device | |
| GB0419571D0 | Scanning particle beam instrument |