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LAYTEC AG

Overview
  • Total Patents
    19
  • GoodIP Patent Rank
    175,617
About

LAYTEC AG has a total of 19 patent applications. Its first patent ever was published in 2009. It filed its patents most often in EPO (European Patent Office), Germany and United States. Its main competitors in its focus markets measurement, surface technology and coating and semiconductors are MIDAC CORP, VALMET AUTOMATION CANADA and CAMPUS TECHNOLOGIES AG.

Patent filings in countries

World map showing LAYTEC AGs patent filings in countries

Patent filings per year

Chart showing LAYTEC AGs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zettler Joerg-Thomas 9
#2 Kaspari Christian 8
#3 Schenk Tobias 5
#4 Zettler Jörg-Thomas 5
#5 Uredat Steffen 3
#6 Henninger Bernd 3
#7 Zilian Jens 3
#8 Haberland Kolja 3
#9 Anttu Nicklas 2
#10 Zettler Johannes 2

Latest patents

Publication Filing date Title
DE102020111293A1 Method and device for in-situ determination of the temperature of a wafer
DE102018128983A1 Method for determining temperature and associated spectral reflection measuring system
DE102018128993A1 Spectroscopy arrangement and method for spectroscopy
DE102016103405A1 Device for processing at least one workpiece
DE102015120383A1 Method and temperature measuring device for determining the temperature of a sample
DE102015205555A1 Method and device for determining a layer property and method for producing an LED
EP2916103A1 Method and appararus for real-time analysis of complex thin-film multi-layer growth processes
EP2887031A1 Method for calibrating a two-wavelength pyrometer, method for determining the temperature of a semiconducting wafer and a system for determining the temperature of a semiconducting wafer
EP2660574A1 Flat light emitting plate for simulating thermal radiation, method for calibrating a pyrometer and method for determining the temperature of a semiconducting wafer
EP2693271A1 Apparatus and method for measuring the dimensions of 1-dimensional and 0-dimensional nanostructures in real-time during epitaxial growth
EP2546600A1 Method and apparatus for real-time determination of spherical and non-spherical curvature of a surface
EP2299236A1 Method and apparatus for real-time determination of curvature and azimuthal asymmetry of a surface
EP2299250A1 Pyrometer adapted for detecting UV-radiation and use thereof
EP2365307A1 Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
EP2251638A1 Method and apparatus for determining the layer thickness and the refractive index of a sample