| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 5 | |
| #2 | WIPO (World Intellectual Property Organization) | 3 | |
| #3 | Israel | 2 | |
| #4 | Belgium | 1 | |
| #5 | Canada | 1 | |
| #6 | China | 1 | |
| #7 | Taiwan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Testing of structures | |
| #2 | Analysing materials | |
| #3 | Measuring length, angles and areas | |
| #4 | Measuring light | |
| #5 | Optical systems | |
| #6 | Special measuring |
| # | Name | Total Patents |
|---|---|---|
| #1 | Beghuin Didier | 10 |
| #2 | Joannes Luc | 4 |
| #3 | Didier Beghuin | 3 |
| #4 | Antoine Philippe | 2 |
| #5 | Joannex Luc | 1 |
| #6 | Didier Joannes | 1 |
| #7 | Joannes Didier | 1 |
| #8 | Luc Joannes | 1 |
| #9 | Monnom Olivier | 1 |
| Publication | Filing date | Title |
|---|---|---|
| BE1027225A1 | Deflectometry measuring system | |
| EP2948745A1 | Improvements in or relating to hyperspectral imaging | |
| EP2722650A1 | Angular position sensing | |
| EP2535679A1 | Improvements in or relating to interferometry | |
| TW201042287A | Fourier transform deflectometry system and method | |
| EP2063260A1 | Fourier transform deflectometry system and method |