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JEOL LTD

Overview
  • Total Patents
    6,885
  • GoodIP Patent Rank
    1,743
  • Filing trend
    ⇧ 23.0%
About

JEOL LTD has a total of 6,885 patent applications. It increased the IP activity by 23.0%. Its first patent ever was published in 1963. It filed its patents most often in Japan, United States and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, measurement and machines are VARIAN MAT GMBH, THERMO FINNIGAN LLC and BRUKER AXS KK.

Patent filings per year

Chart showing JEOL LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Tsuno Katsushige 116
#2 Ishihara Morio 73
#3 Kitamura Shinichi 71
#4 Asari Toshihiro 62
#5 Komagata Tadashi 61
#6 Yamada Atsushi 59
#7 Iwatsuki Masashi 56
#8 Matsutani Miyuki 56
#9 Takeuchi Makoto 55
#10 Kobayashi Tatsuji 55

Latest patents

Publication Filing date Title
US2021109119A1 Analysis method of diene compound and production method of ene compound
EP3809445A1 Cooling apparatus for charged particle beam device
EP3806130A2 Electron gun and method of adjusting current of electron gun
US2021096063A1 Analysis Method and Analysis Apparatus
JP2021001906A Analyzer and analysis method
US2021098244A1 Input Lens and Electron Spectrometer
US2021088544A1 Automatic Analyzer and Automatic Analysis Method
EP3799106A1 Sample attachment device
EP3799105A1 Sample chip worktable and retainer
EP3792954A1 Method of acquiring dark-field image
EP3792953A1 Control method for electron microscope and electron microscope
EP3792951A1 Charged particle beam device and analysis method
EP3789140A1 Three-dimensional additive manufacturing device and method with detection of powder bed abnormalities
EP3789139A1 Three-dimensional additive manufacturing method and device with detection of defects with backscattered electrons
US2021069975A1 Additive Manufacturing Machine
EP3790035A1 Sample plate holder
EP3787003A1 Mass spectrum processing apparatus and model generation method
EP3772084A1 Focus adjustment method for charged particle beam device and charged particle beam device
EP3770589A2 Analyzer
US2021018453A1 X-Ray Fluorescence Measurement Apparatus