| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 4 | |
| #2 | China | 2 | |
| #3 | Japan | 2 | |
| #4 | Republic of Korea | 2 | |
| #5 | WIPO (World Intellectual Property Organization) | 2 | |
| #6 | Germany | 1 | |
| #7 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Materials and metallurgy | |
| #3 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Alloys | |
| #3 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Niehuis Ewald | 6 |
| #2 | Hoerster Peter | 4 |
| #3 | Kollmer Felix | 3 |
| #4 | Duetting Andreas | 1 |
| #5 | Felix Kollmer | 1 |
| #6 | Dutting Andreas | 1 |
| #7 | Andreas Duetting | 1 |
| #8 | Ewald Niehuis | 1 |
| #9 | Peter Hoerster | 1 |
| #10 | Kollmer Felix Dr | 1 |
| Publication | Filing date | Title |
|---|---|---|
| DE102010032823A1 | Method and a mass spectrometer for the detection of ions or nachionisierten neutral particles from samples | |
| EP2056333A1 | Liquid metal ion source, secondary ion mass spectrometer, secondary ion mass spectrometric analysis procedure and their applications | |
| EP1891421A1 | Secondary ion mass spectroscopy (sims) with polyatomic primary ion beam, which is directed at a surface coated with caesium | |
| EP1658632A2 | Mass spectrometer and liquid-metal ion source for a mass spectrometer of this type |