| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 5 | |
| #2 | Norway | 5 | |
| #3 | United States | 3 | |
| #4 | WIPO (World Intellectual Property Organization) | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Machines | |
| #3 | Semiconductors | |
| #4 | Optics | |
| #5 | Control | |
| #6 | Surface technology and coating | |
| #7 | Micro-structure and nano-technology |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Postal sorting | |
| #3 | Measuring light | |
| #4 | Semiconductor devices | |
| #5 | Devices using light amplification | |
| #6 | Nanostructure applications | |
| #7 | Alarm systems | |
| #8 | Optical systems | |
| #9 | Single-crystal-growth |
| # | Name | Total Patents |
|---|---|---|
| #1 | Bugge Renato | 16 |
| #2 | Nilsen Tron Arne | 1 |
| #3 | Fimland Bjoern-Ove | 1 |
| #4 | Myrvågnes Geir | 1 |
| Publication | Filing date | Title |
|---|---|---|
| EP2748838A1 | Method for growing iii-v materials on a silicon substrate comprising steps improving dislocation fault density of a finished material structure suitable for use in transistors, lasers and solar cells | |
| EP2406613A1 | Method and system for the measurement/detection of chemical spillage | |
| WO2009075580A1 | Method and system for measuring and determining/identifying different materials | |
| US2010141949A1 | Measuring of fuel composition by using laser | |
| US2009090902A1 | Optical devices using a penternary III-V material system |